| 10830841 |
Magnetic tunnel junction performance monitoring based on magnetic field coupling |
Benjamin D. Briggs, Michael Rizzolo, Lawrence A. Clevenger, Theodorus E. Standaert, James H. Stathis |
2020-11-10 |
| 10796833 |
Magnetic tunnel junction with low series resistance |
Benjamin D. Briggs, Michael Rizzolo, Theodorus E. Standaert, Lawrence A. Clevenger, James H. Stathis |
2020-10-06 |
| 10770511 |
Structures and methods for embedded magnetic random access memory (MRAM) fabrication |
Lawrence A. Clevenger, Michael Rizzolo, Theodorus E. Standaert |
2020-09-08 |
| 10746782 |
Accelerated wafer testing using non-destructive and localized stress |
Benjamin D. Briggs, Lawrence A. Clevenger, Michael Rizzolo, Theodorus E. Standaert, James H. Stathis |
2020-08-18 |
| 10741751 |
Fully aligned semiconductor device with a skip-level via |
Benjamin D. Briggs, Chih-Chao Yang, Hsueh-Chung Chen, Lawrence A. Clevenger |
2020-08-11 |
| 10739397 |
Accelerated wafer testing using non-destructive and localized stress |
Benjamin D. Briggs, Lawrence A. Clevenger, Michael Rizzolo, Theodorus E. Standaert, James H. Stathis |
2020-08-11 |
| 10727124 |
Structure and method for forming fully-aligned trench with an up-via integration scheme |
Lawrence A. Clevenger, Benjamin D. Briggs |
2020-07-28 |
| 10720567 |
Prevention of switching of spins in magnetic tunnel junctions by on-chip parasitic magnetic shield |
Benjamin D. Briggs, Lawrence A. Clevenger, Michael Rizzolo, Theodorus E. Standaert |
2020-07-21 |
| 10553789 |
Fully aligned semiconductor device with a skip-level via |
Benjamin D. Briggs, Chih-Chao Yang, Hsueh-Chung Chen, Lawrence A. Clevenger |
2020-02-04 |
