Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725381 | Optical systems, metrology apparatus and associated method | Sietse Thijmen Van Der Post, Stefan Michael Bruno Bäumer, Peter Danny Van Voorst, Teunis Willem Tukker, Han-Kwang Nienhuys +1 more | 2020-07-28 |
| 10578979 | Method and apparatus for inspection and metrology | Sietse Thijmen Van Der Post, Sander Bas Roobol | 2020-03-03 |