Issued Patents 2019
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10502692 | Automated metrology system selection | Meng Cao, Lie-Quan Lee, Heyin Li, Mengmeng Ye | 2019-12-10 |
| 10458912 | Model based optical measurements of semiconductor structures with anisotropic dielectric permittivity | Houssam Chouaib, Andrei V. Shchegrov, Zhengquan Tan | 2019-10-29 |
| 10410935 | Dispersion model for band gap tracking | Natalia Malkova, Leonid Poslavsky, Ming Di, Dawei Hu | 2019-09-10 |
| 10393647 | System, method, and computer program product for automatically determining a parameter causing an abnormal semiconductor metrology measurement | Liequan Lee, Jonathan Iloreta, Hong Qiu, Leonid Poslavsky | 2019-08-27 |
| 10345721 | Measurement library optimization in semiconductor metrology | Meng Cao, Lie-Quan Lee, Heyin Li, Mengmeng Ye | 2019-07-09 |
| 10239045 | Inorganic composite oxides and methods of making the same | Barry William Luke Southward, Francis Francis, Fabien Ocampo | 2019-03-26 |