Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10502692 | Automated metrology system selection | Meng Cao, Lie-Quan Lee, Qiang Zhao, Heyin Li | 2019-12-10 |
| 10345721 | Measurement library optimization in semiconductor metrology | Meng Cao, Lie-Quan Lee, Qiang Zhao, Heyin Li | 2019-07-09 |