Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10401300 | Defect observation method and device and defect detection device | Yuko Otani, Toshifumi Honda | 2019-09-03 |
| 10352879 | X-ray inspection method and device | Toshiyuki Nakao, Kaifeng Zhang, Hideaki Sasazawa | 2019-07-16 |
| 10261026 | Defect inspection method, low light detecting method, and low light detector | Toshifumi Honda, Takahiro Jingu | 2019-04-16 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2019-04-09 |
| 10228332 | Defect inspection device and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Taketo Ueno, Yuko Otani | 2019-03-12 |