Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466181 | Flaw inspection device and flaw inspection method | Takahiro Urano, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai | 2019-11-05 |
| 10401300 | Defect observation method and device and defect detection device | Yuko Otani, Yuta Urano | 2019-09-03 |
| 10261026 | Defect inspection method, low light detecting method, and low light detector | Yuta Urano, Takahiro Jingu | 2019-04-16 |
| 10228332 | Defect inspection device and defect inspection method | Yuta Urano, Shunichi Matsumoto, Taketo Ueno, Yuko Otani | 2019-03-12 |