Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10436576 | Defect reviewing method and device | Yohei Minekawa, Yuji Takagi | 2019-10-08 |
| 10401300 | Defect observation method and device and defect detection device | Yuta Urano, Toshifumi Honda | 2019-09-03 |
| 10267745 | Defect detection method and defect detection device and defect observation device provided with same | Takehiro Tachizaki, Masahiro Watanabe, Shunichi Matsumoto | 2019-04-23 |
| 10228332 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Shunichi Matsumoto, Taketo Ueno | 2019-03-12 |