Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10346288 | Operation verifying apparatus, operation verifying method and operation verifying system | Mamoru Yasuda, Takaya Higashino, Eiji Nabika, Hayato Takabatake, Takuma Ishibashi +1 more | 2019-07-09 |
| 10267745 | Defect detection method and defect detection device and defect observation device provided with same | Yuko Otani, Takehiro Tachizaki, Masahiro Watanabe | 2019-04-23 |
| 10228332 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Taketo Ueno, Yuko Otani | 2019-03-12 |