Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10436576 | Defect reviewing method and device | Yuko Otani, Yuji Takagi | 2019-10-08 |
| 10297021 | Defect quantification method, defect quantification device, and defect evaluation value display device | Yuji Takagi, Takehiro Hirai | 2019-05-21 |
| 10203851 | Defect classification apparatus and defect classification method | Yuji Takagi, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2019-02-12 |