Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10203851 | Defect classification apparatus and defect classification method | Yohei Minekawa, Yuji Takagi, Minoru Harada, Takehiro Hirai | 2019-02-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10203851 | Defect classification apparatus and defect classification method | Yohei Minekawa, Yuji Takagi, Minoru Harada, Takehiro Hirai | 2019-02-12 |