Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10297021 | Defect quantification method, defect quantification device, and defect evaluation value display device | Yohei Minekawa, Yuji Takagi | 2019-05-21 |
| 10229812 | Sample observation method and sample observation device | Minoru Harada, Yuji Takagi | 2019-03-12 |
| 10203851 | Defect classification apparatus and defect classification method | Yohei Minekawa, Yuji Takagi, Minoru Harada, Ryo Nakagaki | 2019-02-12 |
| 10168286 | Defect observation device and defect observation method | Hideki Nakayama, Kenichi Nishigata | 2019-01-01 |