Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10402548 | Authentication system and method | Rie Yamaguchi, Tatsuya Harada, Daisuke Sakamoto | 2019-09-03 |
| 10318805 | Pattern matching method and apparatus | Masashi Sakamoto | 2019-06-11 |
| 10168286 | Defect observation device and defect observation method | Takehiro Hirai, Kenichi Nishigata | 2019-01-01 |