Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10168286 | Defect observation device and defect observation method | Takehiro Hirai, Hideki Nakayama | 2019-01-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10168286 | Defect observation device and defect observation method | Takehiro Hirai, Hideki Nakayama | 2019-01-01 |