Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10401304 | Examination device | Masami Makuuchi, Kazuma Ogawa | 2019-09-03 |
| 10261027 | Inspection device | Yoshio Kimoto | 2019-04-16 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2019-04-09 |