SM

Shigenobu Maruyama

HH Hitachi High-Technologies: 1 patents #144 of 434Top 35%
📍 Oiso, JP: #3 of 3 inventorsTop 100%
Overall (2019): #272,830 of 560,194Top 50%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10254235 Defect inspecting method and defect inspecting apparatus Toshiyuki Nakao, Akira Hamamatsu, Yuta Urano 2019-04-09