Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10352879 | X-ray inspection method and device | Yuta Urano, Kaifeng Zhang, Hideaki Sasazawa | 2019-07-16 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2019-04-09 |