Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429411 | Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method | Shinichi Taniguchi | 2019-10-01 |
| 10352879 | X-ray inspection method and device | Toshiyuki Nakao, Yuta Urano, Hideaki Sasazawa | 2019-07-16 |