EP

Engelbertus Antonius Fransiscus Van Der Pasch

AB Asml Netherlands B.V.: 8 patents #17 of 721Top 3%
CG Carl Zeiss Smt Gmbh: 1 patents #71 of 205Top 35%
📍 Oirschot, NL: #2 of 7 inventorsTop 30%
Overall (2019): #11,452 of 560,194Top 3%
9
Patents 2019

Issued Patents 2019

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDate
10509325 Position measurement of optical elements in a lithographic apparatus Erik Loopstra, Sascha Bleidistel, Suzanne Cosijn 2019-12-17
10466599 Lithographic apparatus Hans Butler, Paul Corné Henri DE WIT 2019-11-05
10444635 Lithographic method and apparatus Carolus Johannes Catharina Schoormans, Johannes Jacobus Matheus Baselmans, Johannes A. T. M. Van Den Homberg, Maksym SLADKOV, Andreas Johannes Antonius Brouns +1 more 2019-10-15
10345717 Lithographic apparatus and method Günes NAKIBOGLU, Suzanne Johanna Antonetta Geertruda Cosijns, Anne Willemijn Bertine Quist, Lukasz Sosniak, Frank Johannes Jacobus Van Boxtel 2019-07-09
10331045 Position measurement system and lithographic apparatus Emiel Jozef Melanie Eussen, Robbert Edgar Van Leeuwen 2019-06-25
10310392 Positioning device, lithographic apparatus and device manufacturing method Hans Butler, Johannes Petrus Martinus Bernardus Vermeulen 2019-06-04
10289011 Position measurement system, interferometer and lithographic apparatus Robbert Edgar Van Leeuwen 2019-05-14
10216102 Lithographic apparatus and device manufacturing method Jan Steven Christiaan Westerlaken, Gerardus Arnoldus Hendricus Franciscus Janssen, Peter Paul Steijaert, Franciscus Van De Mast 2019-02-26
10209634 Lithographic apparatus and device manufacturing method Hans Butler, Maurice Willem Jozef Etiënne Wijckmans, Christiaan Alexander Hoogendam, Bernardus Antonius Johannes Luttikhuis 2019-02-19