Issued Patents 2017
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817029 | Test probing structure | Mill-Jer Wang, Ching-Fang Chen, Sandeep Kumar Goel, Chung-Sheng Yuan, Chao-Yang Yeh +2 more | 2017-11-14 |
| 9754847 | Circuit probing structures and methods for probing the same | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2017-09-05 |
| 9671457 | 3D IC testing apparatus | Mill-Jer Wang, Chih-Chia Chen, Ching-Nen Peng, Hao Chen | 2017-06-06 |
| 9664707 | Testing holders for chip unit and die package | Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hao Chen | 2017-05-30 |
| 9658281 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Mincent Lee | 2017-05-23 |
| 9653927 | Composite integrated circuits and methods for wireless interactions therewith | Min-Jer Wang, Ching-Nen Peng, Chewn-Pu Jou, Feng-Wei Kuo, Hao Chen +4 more | 2017-05-16 |
| 9640447 | Test circuit and method | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Chung-Han Huang | 2017-05-02 |
| 9606155 | Capacitance measurement circuit and method | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Chung-Han Huang | 2017-03-28 |
| 9568543 | Structure and method for testing stacked CMOS structure | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2017-02-14 |
| 9559583 | Power converter with a wave generator that filters a wave signal to generate an output voltage | Hung-I Wang, Hao-Ping Hong, Chien-Wei Kuan, Yung-Chih Yen | 2017-01-31 |