Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9640447 | Test circuit and method | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2017-05-02 |
| 9606155 | Capacitance measurement circuit and method | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2017-03-28 |