Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9658281 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2017-05-23 |
ML
Mincent Lee
Overall (2017): #306,827 of 506,227Top 65%
1
Patents 2017