Issued Patents 2017
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9837309 | Semiconductor via structure with lower electrical resistance | Lawrence A. Clevenger, Baozhen Li, Terry A. Spooner, Junli Wang | 2017-12-05 |
| 9778726 | Deterministic current based frequency optimization of processor chip | Malcolm S. Allen-Ware, Michael Stephen Floyd, Joshua D. Friedrich, Charles R. Lefurgy, Karthick Rajamani +5 more | 2017-10-03 |
| 9768116 | Optimized wires for resistance or electromigration | Lawrence A. Clevenger, Baozhen Li | 2017-09-19 |
| 9761482 | Enhancement of iso-via reliability | Lawrence A. Clevenger, Baozhen Li, Xiao Hu Liu | 2017-09-12 |
| 9740080 | Waveguide switch with tuned photonic microring | John J. Ellis-Monaghan, Jeffrey P. Gambino, Mark D. Jaffe, Jed H. Rankin | 2017-08-22 |
| 9741706 | Immunity to inline charging damage in circuit designs | Zachary Henderson, Jason D. Hibbeler, Terence B. Hook, Nicholas Palmer | 2017-08-22 |
| 9741707 | Immunity to inline charging damage in circuit designs | Zachary Henderson, Jason D. Hibbeler, Terence B. Hook, Nicholas Palmer | 2017-08-22 |
| 9711452 | Optimized wires for resistance or electromigration | Lawrence A. Clevenger, Baozhen Li | 2017-07-18 |
| 9712112 | Dynamic noise mitigation in integrated circuit devices using local clock buffers | Miles C. Pedrone, John E. Sheets, II, Andrew A. Turner | 2017-07-18 |
| 9685407 | Optimized wires for resistance or electromigration | Lawrence A. Clevenger, Baozhen Li | 2017-06-20 |
| 9673116 | On chip electrostatic discharge (ESD) event monitoring | John Bradley Deforge, Junjun Li, Alain Loiseau | 2017-06-06 |
| 9658255 | Signal monitoring of through-wafer vias using a multi-layer inductor | Mark A. DiRocco, Norman W. Robson, Keith C. Stevens | 2017-05-23 |
| 9627575 | Photodiode structures | John J. Ellis-Monaghan, Jeffrey P. Gambino, Mark D. Jaffe | 2017-04-18 |
| 9575115 | Methodology of grading reliability and performance of chips across wafer | Nathaniel R. Chadwick, James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li +2 more | 2017-02-21 |