Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9575115 | Methodology of grading reliability and performance of chips across wafer | James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Souvick Mitra +2 more | 2017-02-21 |
NC
Nathaniel R. Chadwick
Overall (2017): #298,544 of 506,227Top 60%
1
Patents 2017