Issued Patents 2017
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842723 | Defect observation system and defect observation method | Masashi Sakamoto, Hideki Nakayama | 2017-12-12 |
| 9811897 | Defect observation method and defect observation device | Minoru Harada, Yuji Takagi, Ryo Nakagaki, Hirohiko Kitsuki | 2017-11-07 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Shunji Maeda, Yuta Urano, Toshifumi Honda, Satoru Takahashi +1 more | 2017-08-15 |
| 9685301 | Charged-particle radiation apparatus | Ryo Nakagaki, Kenji Obara | 2017-06-20 |
| 9582875 | Defect analysis assistance device, program executed by defect analysis assistance device, and defect analysis system | Ryo Nakagaki, Kenji Obara | 2017-02-28 |
| 9569836 | Defect observation method and defect observation device | Ryo Nakagaki, Minoru Harada | 2017-02-14 |