Issued Patents 2017
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778206 | Defect inspection device and defect inspection method | Takahiro Urano, Hidetoshi Nishiyama | 2017-10-03 |
| 9773641 | Method and apparatus for observing defects | Yuko Otani, Yuta Urano | 2017-09-26 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Shunji Maeda, Yuta Urano, Takehiro Hirai, Satoru Takahashi +1 more | 2017-08-15 |
| 9683946 | Method and device for detecting defects and method and device for observing defects | Yuko Otani, Taketo Ueno, Hideki Nakayama | 2017-06-20 |
| 9678021 | Method and apparatus for inspecting defects | Yuta Urano | 2017-06-13 |
| 9645094 | Defect inspection device and defect inspection method | Yuta Urano, Takahiro Jingu, Akira Hamamatsu | 2017-05-09 |
| 9606071 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Yuta Urano | 2017-03-28 |
| 9588055 | Defect inspection apparatus and defect inspection method | Yuta Urano, Taketo Ueno, Akira Hamamatsu | 2017-03-07 |
| 9588054 | Defect inspection method, low light detecting method and low light detector | Yuta Urano, Takahiro Jingu | 2017-03-07 |
| 9568439 | Defect inspection device and defect inspection method | Yuta Urano, Takahiro Jingu, Akira Hamamatsu | 2017-02-14 |