Issued Patents 2017
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823065 | Surface measurement apparatus | Takanori Kondo, Masaaki Ito, Masami Ikota | 2017-11-21 |
| 9791380 | Inspection device and image capture element | — | 2017-10-17 |
| 9779912 | Inspection device and measurement device | Masami Makuuchi | 2017-10-03 |
| 9759669 | Inspection device | — | 2017-09-12 |
| 9645094 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Akira Hamamatsu | 2017-05-09 |
| 9602780 | Apparatus for inspecting defect with time/spatial division optical system | Masaaki Ito, Hidetoshi Nishiyama | 2017-03-21 |
| 9588054 | Defect inspection method, low light detecting method and low light detector | Yuta Urano, Toshifumi Honda | 2017-03-07 |
| 9568439 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Akira Hamamatsu | 2017-02-14 |
| 9568437 | Inspection device | Shunichi Matsumoto, Akira Hamamatsu | 2017-02-14 |
| 9535009 | Inspection system | Kenshiro OHTSUBO, Hidetoshi Nishiyama, Masaaki Ito | 2017-01-03 |