Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841384 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2017-12-12 |
| 9645094 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Takahiro Jingu | 2017-05-09 |
| 9588055 | Defect inspection apparatus and defect inspection method | Yuta Urano, Taketo Ueno, Toshifumi Honda | 2017-03-07 |
| 9568437 | Inspection device | Shunichi Matsumoto, Takahiro Jingu | 2017-02-14 |
| 9568439 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Takahiro Jingu | 2017-02-14 |