Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841384 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2017-12-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841384 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2017-12-12 |