Issued Patents 2017
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841384 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2017-12-12 |
| 9773641 | Method and apparatus for observing defects | Yuko Otani, Toshifumi Honda | 2017-09-26 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Shunji Maeda, Toshifumi Honda, Takehiro Hirai, Satoru Takahashi +1 more | 2017-08-15 |
| 9678021 | Method and apparatus for inspecting defects | Toshifumi Honda | 2017-06-13 |
| 9645094 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Jingu, Akira Hamamatsu | 2017-05-09 |
| 9606071 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Toshifumi Honda | 2017-03-28 |
| 9588055 | Defect inspection apparatus and defect inspection method | Taketo Ueno, Akira Hamamatsu, Toshifumi Honda | 2017-03-07 |
| 9588054 | Defect inspection method, low light detecting method and low light detector | Toshifumi Honda, Takahiro Jingu | 2017-03-07 |
| 9568439 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Jingu, Akira Hamamatsu | 2017-02-14 |