Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9683946 | Method and device for detecting defects and method and device for observing defects | Yuko Otani, Hideki Nakayama, Toshifumi Honda | 2017-06-20 |
| 9588055 | Defect inspection apparatus and defect inspection method | Yuta Urano, Akira Hamamatsu, Toshifumi Honda | 2017-03-07 |
| 9535013 | Method and apparatus for inspecting defect | Shunichi Matsumoto, Atsushi Taniguchi | 2017-01-03 |