Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778206 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Urano | 2017-10-03 |
| 9602780 | Apparatus for inspecting defect with time/spatial division optical system | Masaaki Ito, Takahiro Jingu | 2017-03-21 |
| 9535009 | Inspection system | Kenshiro OHTSUBO, Takahiro Jingu, Masaaki Ito | 2017-01-03 |