Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9811897 | Defect observation method and defect observation device | Yuji Takagi, Ryo Nakagaki, Takehiro Hirai, Hirohiko Kitsuki | 2017-11-07 |
| 9799112 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Ryo Nakagaki, Fumihiko Fukunaga, Yuji Takagi | 2017-10-24 |
| 9569836 | Defect observation method and defect observation device | Takehiro Hirai, Ryo Nakagaki | 2017-02-14 |