Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9811897 | Defect observation method and defect observation device | Minoru Harada, Ryo Nakagaki, Takehiro Hirai, Hirohiko Kitsuki | 2017-11-07 |
| 9799112 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Ryo Nakagaki, Fumihiko Fukunaga | 2017-10-24 |
| 9649701 | Cutting insert and indexable insert-type cutting tool | Nobukazu Horiike | 2017-05-16 |