Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9799112 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Ryo Nakagaki, Yuji Takagi | 2017-10-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9799112 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Ryo Nakagaki, Yuji Takagi | 2017-10-24 |