Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9685301 | Charged-particle radiation apparatus | Takehiro Hirai, Ryo Nakagaki | 2017-06-20 |
| 9582875 | Defect analysis assistance device, program executed by defect analysis assistance device, and defect analysis system | Takehiro Hirai, Ryo Nakagaki | 2017-02-28 |