Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842723 | Defect observation system and defect observation method | Takehiro Hirai, Hideki Nakayama | 2017-12-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842723 | Defect observation system and defect observation method | Takehiro Hirai, Hideki Nakayama | 2017-12-12 |