Issued Patents 2016
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9521372 | Pattern measuring apparatus, pattern measuring method, and computer-readable recording medium on which a pattern measuring program is recorded | Yoshinori Momonoi, Koichi Hamada, Michio Hatano, Hideyuki Kazumi | 2016-12-13 |
| 9511427 | Cutting insert and indexable insert-type cutting tool | Nobukazu Horiike | 2016-12-06 |
| 9496985 | Decoding system and decoding method | Tsuyoshi Nakasendo, Yasumori Hino, Kohei Nakata | 2016-11-15 |
| 9401015 | Defect classification method, and defect classification system | Yohei Minekawa, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-07-26 |
| 9390490 | Method and device for testing defect using SEM | Minoru Harada, Ryo Nakagaki, Naoki Hosoya, Toshifumi Honda, Takehiro Hirai | 2016-07-12 |