Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9521372 | Pattern measuring apparatus, pattern measuring method, and computer-readable recording medium on which a pattern measuring program is recorded | Yoshinori Momonoi, Koichi Hamada, Yuji Takagi, Hideyuki Kazumi | 2016-12-13 |
| 9472376 | Scanning electron microscope | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Hiroshi Makino, Yuzuru Mizuhara +2 more | 2016-10-18 |
| 9245711 | Charged particle beam apparatus and image forming method | Yusuke Abe, Zhigang Wang | 2016-01-26 |