Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9521372 | Pattern measuring apparatus, pattern measuring method, and computer-readable recording medium on which a pattern measuring program is recorded | Koichi Hamada, Yuji Takagi, Michio Hatano, Hideyuki Kazumi | 2016-12-13 |
| 9472376 | Scanning electron microscope | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Hiroshi Makino, Yuzuru Mizuhara +2 more | 2016-10-18 |