Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9401015 | Defect classification method, and defect classification system | Yuji Takagi, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-07-26 |
| 9342879 | Method and apparatus for reviewing defect | Kenji Nakahira, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-05-17 |