Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9390490 | Method and device for testing defect using SEM | Yuji Takagi, Minoru Harada, Ryo Nakagaki, Toshifumi Honda, Takehiro Hirai | 2016-07-12 |
| 9311697 | Inspection method and device therefor | Minoru Harada, Ryo Nakagaki, Takehiro Hirai | 2016-04-12 |
| 9291604 | Method for measurement of vibration property of structure, and vibration property measurement device | Itsuro Kajiwara | 2016-03-22 |