Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9461149 | Nanowire structure with selected stack removed for reduced gate resistance and method of fabricating same | Hongmei Li, Junjun Li, Xiaoping Liang | 2016-10-04 |
| 9287185 | Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations | Griselda Bonilla, Baozhen Li, Barry P. Linder, James H. Stathis, Ernest Y. Wu | 2016-03-15 |
| 9269786 | Silicon nitride layer deposited at low temperature to prevent gate dielectric regrowth high-K metal gate field effect transistors | Anthony I. Chou, Arvind Kumar, Shreesh Narasimha, Claude Ortolland | 2016-02-23 |