Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9395403 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2016-07-19 |
| 9310418 | Correction for stress induced leakage current in dielectric reliability evaluations | Steven W. Mittl | 2016-04-12 |
| 9287185 | Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations | Griselda Bonilla, Baozhen Li, Barry P. Linder, James H. Stathis, Kai Zhao | 2016-03-15 |