Issued Patents 2016
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9506977 | Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies | Mark A. Burns, Douglas S. Dewey, Daniel Reinhardt | 2016-11-29 |
| 9489482 | Reliability-optimized selective voltage binning | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2016-11-08 |
| 9430603 | Scaling voltages in relation to die location | Eric A. Foreman, Kerim Kalafala | 2016-08-30 |
| 9395403 | Optimization of integrated circuit reliability | Carole D. Graas, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2016-07-19 |
| 9354953 | System integrator and system integration method with reliability optimized integrated circuit chip selection | Jeanne P. Bickford, Baozhen Li | 2016-05-31 |