Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9506977 | Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies | Mark A. Burns, Nazmul Habib, Daniel Reinhardt | 2016-11-29 |
| 9429619 | Reliability test screen optimization | Theodoros E. Anemikos, Jeanne P. Bickford, Ernest A. Viau, Jr. | 2016-08-30 |
| 9310426 | On-going reliability monitoring of integrated circuit chips in the field | Theodoros E. Anemikos, Pascal A. Nsame, Anthony D. Polson | 2016-04-12 |