Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9310418 | Correction for stress induced leakage current in dielectric reliability evaluations | Ernest Y. Wu | 2016-04-12 |
| 9310424 | Monitoring aging of silicon in an integrated circuit device | Malcolm S. Allen-Ware, Ronald J. Bolam, Alan J. Drake, Charles R. Lefurgy, Barry P. Linder +1 more | 2016-04-12 |