Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9287185 | Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations | Griselda Bonilla, Baozhen Li, Barry P. Linder, Ernest Y. Wu, Kai Zhao | 2016-03-15 |