| 9530798 |
High performance heat shields with reduced capacitance |
Sungjae Lee, Joseph M. Lukaitis, Robert R. Robison |
2016-12-27 |
| 9508826 |
Replacement gate structure for enhancing conductivity |
Arvind Kumar, Sungjae Lee |
2016-11-29 |
| 9484246 |
Buried signal transmission line |
Arvind Kumar, Sungjae Lee, Richard A. Wachnik |
2016-11-01 |
| 9450072 |
Replacement gate structure for enhancing conductivity |
Arvind Kumar, Sungjae Lee |
2016-09-20 |
| 9425079 |
Semiconductor structure with integrated passive structures |
Arvind Kumar, Renee T. Mo, Shreesh Narasimha |
2016-08-23 |
| 9412759 |
CMOS gate contact resistance reduction |
Arvind Kumar, Sungjae Lee |
2016-08-09 |
| 9412667 |
Asymmetric high-k dielectric for reducing gate induced drain leakage |
Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw |
2016-08-09 |
| 9401325 |
Planar polysilicon regions for precision resistors and electrical fuses and method of fabrication |
Arvind Kumar, Renee T. Mo, Shreesh Narasimha |
2016-07-26 |
| 9400511 |
Methods and control systems of resistance adjustment of resistors |
Arvind Kumar, Sungjae Lee |
2016-07-26 |
| 9269786 |
Silicon nitride layer deposited at low temperature to prevent gate dielectric regrowth high-K metal gate field effect transistors |
Arvind Kumar, Shreesh Narasimha, Claude Ortolland, Kai Zhao |
2016-02-23 |
