Issued Patents 2016
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9453873 | Non-planar field effect transistor test structure and lateral dielectric breakdown testing method | Roger A. Dufresne, Kevin Kolvenbach, Michael A. Shinosky | 2016-09-27 |
| 9404953 | Structures and methods for monitoring dielectric reliability with through-silicon vias | Mukta G. Farooq, John A. Griesemer, Chandrasekharan Kothandaraman, John M. Safran, Timothy D. Sullivan | 2016-08-02 |
| 9318413 | Integrated circuit structure with metal cap and methods of fabrication | Andrew Tae Kim, Minhua Lu, Timothy D. Sullivan, Ping-Chuan Wang, Lijuan Zhang | 2016-04-19 |
| 9318414 | Integrated circuit structure with through-semiconductor via | Minhua Lu, Timothy D. Sullivan, Ping-Chuan Wang, Lijuan Zhang | 2016-04-19 |
| 9287345 | Semiconductor structure with thin film resistor and terminal bond pad | Jeffrey P. Gambino, Zhong-Xiang He, Tom C. Lee, John C. Malinowski, Anthony K. Stamper | 2016-03-15 |
| 9230914 | Copper wire and dielectric with air gaps | Jeffrey P. Gambino, Zhong-Xiang He, Trevor A. Thompson, Eric J. White | 2016-01-05 |