Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9404953 | Structures and methods for monitoring dielectric reliability with through-silicon vias | Fen Chen, Mukta G. Farooq, John A. Griesemer, Chandrasekharan Kothandaraman, Timothy D. Sullivan | 2016-08-02 |